Interlayer exchange coupling dependence of thermal stability parameters in synthetic antiferromagnetic free layers

Y. Saito, H. Sugiyama, T. Inokuchi, K. Inomata

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5 Citations (Scopus)

Abstract

We conducted a detailed study of the interlayer exchange coupling (JEX) dependence of thermal stability properties of magnetic tunnel junctions (MTJs) with synthetic antiferromagnetic (Syn-AF) free layers. The thermal stability properties were investigated using the junction magnetoresistance of current-perpendicular MTJ devices with a word line as probes. The observed sweep-rate-dependent coercivities were analyzed using the Sharrock formula. The results confirmed the existence of strong JEX dependence on thermal stability parameters (Ku VkT) in Syn-AF free layers. The values of Ku VkT for MTJs with Syn-AF free layers decreased with a decrease in the strength of JEX, and the increase in the effective volume of the Syn-AF free layer disappeared at JEX ≤0.52 erg cm2. The Syn-AF free layer with JEX >0.52 erg cm2 is relevant for high-density spin electronic nanodevices with a low aspect ratio.

Original languageEnglish
Article number08K702
JournalJournal of Applied Physics
Volume99
Issue number8
DOIs
Publication statusPublished - 2006 May 25
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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