Interlayer exchange coupling (IEC) in epitaxially grown Co 2MnSi/X/Co2MnSi (X=Cr and V) trilayers has been studied for different thicknesses of X spacer layers. The samples were grown by UHV-compatible dc-sputtering on an MgO (001) substrate. Strong biquadratic coupling with an unusual large oscillation period (3.3-3.5 nm) was observed for X=Cr while no evidence for non-ferromagnetic type IEC was found for X=V.
ASJC Scopus subject areas
- Physics and Astronomy(all)