Intergrowth microstructures of MnF2 subjected to shock compression

K. Yubuta, T. Hongo, T. Atou, K. G. Nakamura, K. I. Kondo, M. Kikuchi

Research output: Contribution to journalArticlepeer-review

Abstract

Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and -PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the -PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.

Original languageEnglish
Pages (from-to)323-330
Number of pages8
JournalPhilosophical Magazine
Volume89
Issue number4
DOIs
Publication statusPublished - 2009 Feb 1

Keywords

  • Electron diffraction
  • Electron microscopy image
  • High-resolution transmission
  • Intergrowth
  • Ledge structure
  • Shock compression

ASJC Scopus subject areas

  • Condensed Matter Physics

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