Intergrowth microstructures of MnF2 subjected to shock compression

K. Yubuta; T. Hongo; T. Atou; K. G. Nakamura; K. I. Kondo; M. Kikuchi

doi:10.1080/14786430802620724

Intergrowth microstructures of MnF2 subjected to shock compression

K. Yubuta, T. Hongo, T. Atou, K. G. Nakamura, K. I. Kondo, M. Kikuchi

Materials Development Division

Research output: Contribution to journal › Article › peer-review

Abstract

Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and -PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the -PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.

Original language	English
Pages (from-to)	323-330
Number of pages	8
Journal	Philosophical Magazine
Volume	89
Issue number	4
DOIs	https://doi.org/10.1080/14786430802620724
Publication status	Published - 2009 Feb 1

Keywords

Electron diffraction
Electron microscopy image
High-resolution transmission
Intergrowth
Ledge structure
Shock compression

ASJC Scopus subject areas

Condensed Matter Physics

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10.1080/14786430802620724

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abstract = "Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and -PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the -PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.",

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AU - Yubuta, K.

AU - Hongo, T.

AU - Atou, T.

AU - Nakamura, K. G.

AU - Kondo, K. I.

AU - Kikuchi, M.

PY - 2009/2/1

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N2 - Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and -PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the -PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.

AB - Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and -PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the -PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.

KW - Electron diffraction

KW - Electron microscopy image

KW - High-resolution transmission

KW - Intergrowth

KW - Ledge structure

KW - Shock compression

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