Abstract
Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and -PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the -PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.
Original language | English |
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Pages (from-to) | 323-330 |
Number of pages | 8 |
Journal | Philosophical Magazine |
Volume | 89 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2009 Feb |
Externally published | Yes |
Keywords
- Electron diffraction
- Electron microscopy image
- High-resolution transmission
- Intergrowth
- Ledge structure
- Shock compression
ASJC Scopus subject areas
- Condensed Matter Physics