Interferometry by coherent convergent-beam electron diffraction

Kenji Tsuda, Michiyoshi Tanaka

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The interference fringes with a lattice spacing of 1.28 Å for the 220 reflection of cubic boron nitride (BN) have been observed in convergent-beam electron diffraction (CBED) patterns using a JEM-2010F electron microscope. It is demonstrated that the coherent CBED method acts as an interferometer when the two waves passing through both sides of an edge-on stacking fault are superposed coherently. The displacement vectors at stacking faults in Si and TiO2 have been measured.

Original languageEnglish
Pages (from-to)59-63
Number of pages5
JournalJournal of Electron Microscopy
Volume45
Issue number1
DOIs
Publication statusPublished - 1996 Jan 1

Keywords

  • Coherent electron beam
  • Convergent-beam electron diffraction
  • Interference fringes
  • Interferometry
  • Stacking fault

ASJC Scopus subject areas

  • Instrumentation

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