Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope

Ken Harada, Tetsuya Akashi, Kodai Niitsu, Keiko Shimada, Yoshimasa A. Ono, Daisuke Shindo, Hiroyuki Shinada, Shigeo Mori

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4 Citations (Scopus)

Abstract

Advanced electron microscopy technologies have made it possible to perform precise double-slit interference experiments. We used a 1.2-MV field emission electron microscope providing coherent electron waves and a direct detection camera system enabling single-electron detections at a subsecond exposure time. We developed a method to perform the interference experiment by using an asymmetric double-slit fabricated by a focused ion beam instrument and by operating the microscope under a "pre-Fraunhofer" condition, different from the Fraunhofer condition of conventional double-slit experiments. Here, pre-Fraunhofer condition means that each single-slit observation was performed under the Fraunhofer condition, while the double-slit observations were performed under the Fresnel condition. The interference experiments with each single slit and with the asymmetric double slit were carried out under two different electron dose conditions: high-dose for calculation of electron probability distribution and low-dose for each single electron distribution. Finally, we exemplified the distribution of single electrons by color-coding according to the above three types of experiments as a composite image.

Original languageEnglish
Article number1008
JournalScientific reports
Volume8
Issue number1
DOIs
Publication statusPublished - 2018 Dec 1

ASJC Scopus subject areas

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    Harada, K., Akashi, T., Niitsu, K., Shimada, K., Ono, Y. A., Shindo, D., Shinada, H., & Mori, S. (2018). Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope. Scientific reports, 8(1), [1008]. https://doi.org/10.1038/s41598-018-19380-4