Interference effects on the critical current in a clean-limit superconductor-normal-metal-superconductor junction

Hideaki Takayanagi, Tatsushi Akazaki, Junsaku Nitta

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)

Abstract

Interference effects are confirmed on the critical current of a gate-fitted superconductor-normal-metal-superconductor junction in the clean limit. As the normal metal, the junction uses a two-dimensional electron gas (2DEG) with a high mobility of 7.38 m2/Vs and a high carrier density of 1.98×1012 cm-2 at 4.2 K. The superconducting critical current that flows through the 2DEG is measured as a function of the gate voltage and shows oscillations as a function of the 2DEG carrier concentration. This oscillation is explained by the interference effects predicted by Chrestin et al. The typical period of the oscillation agrees well with the theoretical prediction.

Original languageEnglish
Pages (from-to)1374-1377
Number of pages4
JournalPhysical Review B
Volume51
Issue number2
DOIs
Publication statusPublished - 1995
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics

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