Interfacial carrier dynamics of graphene on SiC, traced by the full-range time-resolved core-level photoemission spectroscopy

T. Someya, H. Fukidome, N. Endo, K. Takahashi, S. Yamamoto, I. Matsuda

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Carrier dynamics through a heterointerface of a Dirac material and a semiconductor was studied by the measurement of the full-range time-resolved core-level photoemission spectroscopy using synchrotron radiation. The electron-hole recombination process during relaxation of the surface photovoltage effect was delayed in a graphene layer due to the bottleneck effect of Dirac cones. When an intermediate buffer layer exists, the recombination mainly takes place at the interfacial Si dangling-bond sites and the relaxation time shortens by one-order of magnitude. The present result demonstrates unusual carrier dynamics at a semiconductor surface, terminated by a layer of the Dirac material.

Original languageEnglish
Article number051601
JournalApplied Physics Letters
Volume113
Issue number5
DOIs
Publication statusPublished - 2018 Jul 30

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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