Interfacial atomic structure of twisted few-layer graphene

Ryo Ishikawa, Nathan R. Lugg, Kazutoshi Inoue, Hidetaka Sawada, Takashi Taniguchi, Naoya Shibata, Yuichi Ikuhara

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

A twist in bi-or few-layer graphene breaks the local symmetry, introducing a number of intriguing physical properties such as opening new bandgaps. Therefore, determining the twisted atomic structure is critical to understanding and controlling the functional properties of graphene. Combining low-angle annular dark-field electron microscopy with image simulations, we directly determine the atomic structure of twisted few-layer graphene in terms of a moire superstructure which is parameterized by a single twist angle and lattice constant. This method is shown to be a powerful tool for accurately determining the atomic structure of two-dimensional materials such as graphene, even in the presence of experimental errors. Using coincidence-site-lattice and displacement-shift-complete theories, we show that the in-plane translation state between layers is not a significant structure parameter, explaining why the present method is adequate not only for bilayer graphene but also a few-layered twisted graphene.

Original languageEnglish
Article number21273
JournalScientific reports
Volume6
DOIs
Publication statusPublished - 2016 Feb 18

ASJC Scopus subject areas

  • General

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