Nanomorphologies and cristallographic orientations of the brazed interface of silicon nitride (Si 3N 4) were analyzed via high-resolution transmission electron microscopy. When Si 3N 4 was brazed using an Ag-Cu-Ti alloy, titanium nitride (TiN) nanoparticles were formed adjacent to the ceramic as reaction products, and these nanoparticles were commonly accompanied by C-phase material. The structure of Si 3N 4/TiN interface was wavy on an atomic scale, which was considered to provide anchoring points that offered high mechanical strength. The TiN nanoparticles extended along the  axis of Si 3N 4. The orientation relationship between TiN and β-Si 3N 4 was, as determined from the observed lattice images, that the  direction of TiN was parallel to the  direction of Si 3N 4. The nature of the crystallographic relationships and interface nanomorphologies were also discussed.
|Number of pages||6|
|Journal||Journal of the American Ceramic Society|
|Publication status||Published - 1998 Feb 1|
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry