Abstract
Nanomorphologies and cristallographic orientations of the brazed interface of silicon nitride (Si 3N 4) were analyzed via high-resolution transmission electron microscopy. When Si 3N 4 was brazed using an Ag-Cu-Ti alloy, titanium nitride (TiN) nanoparticles were formed adjacent to the ceramic as reaction products, and these nanoparticles were commonly accompanied by C-phase material. The structure of Si 3N 4/TiN interface was wavy on an atomic scale, which was considered to provide anchoring points that offered high mechanical strength. The TiN nanoparticles extended along the [0001] axis of Si 3N 4. The orientation relationship between TiN and β-Si 3N 4 was, as determined from the observed lattice images, that the [110] direction of TiN was parallel to the [0001] direction of Si 3N 4. The nature of the crystallographic relationships and interface nanomorphologies were also discussed.
Original language | English |
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Pages (from-to) | 363-368 |
Number of pages | 6 |
Journal | Journal of the American Ceramic Society |
Volume | 81 |
Issue number | 2 |
Publication status | Published - 1998 Feb 1 |
Externally published | Yes |
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry