Infrared spectroscopy of pentacene thin film on SiO 2 surface

Yoshinobu Hosoi, Koshi Okamura, Yasuo Kimura, Hisao Ishii, Michio Niwano

Research output: Contribution to journalConference article

30 Citations (Scopus)

Abstract

The thin film of pentacene on a SiO 2 surface has been investigated by infrared spectroscopy in the multiple internal reflections (MIR) mode. It was found that the molecules in the monolayer are arranged with their molecular axes perpendicular to the surface, and that this arrangement is conserved during film growth up to a 70-nm thickness. In addition, the assignment of the infrared active vibrational modes is discussed.

Original languageEnglish
Pages (from-to)607-610
Number of pages4
JournalApplied Surface Science
Volume244
Issue number1-4
DOIs
Publication statusPublished - 2005 May 15
Event12th International Conference on Solid Films and Surfaces - Hammatsu, Japan
Duration: 2004 Jun 212004 Jun 25

Keywords

  • Film structure
  • Infrared spectroscopy
  • Pentacene
  • SiO surface

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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    Hosoi, Y., Okamura, K., Kimura, Y., Ishii, H., & Niwano, M. (2005). Infrared spectroscopy of pentacene thin film on SiO 2 surface Applied Surface Science, 244(1-4), 607-610. https://doi.org/10.1016/j.apsusc.2004.10.131