Abstract
The thin film of pentacene on a SiO 2 surface has been investigated by infrared spectroscopy in the multiple internal reflections (MIR) mode. It was found that the molecules in the monolayer are arranged with their molecular axes perpendicular to the surface, and that this arrangement is conserved during film growth up to a 70-nm thickness. In addition, the assignment of the infrared active vibrational modes is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 607-610 |
| Number of pages | 4 |
| Journal | Applied Surface Science |
| Volume | 244 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - 2005 May 15 |
| Event | 12th International Conference on Solid Films and Surfaces - Hammatsu, Japan Duration: 2004 Jun 21 → 2004 Jun 25 |
Keywords
- Film structure
- Infrared spectroscopy
- Pentacene
- SiO surface
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films
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Cite this
Hosoi, Y., Okamura, K., Kimura, Y., Ishii, H., & Niwano, M. (2005). Infrared spectroscopy of pentacene thin film on SiO 2 surface Applied Surface Science, 244(1-4), 607-610. https://doi.org/10.1016/j.apsusc.2004.10.131