Infrared spectroscopy of pentacene thin film on SiO                         2                          surface

Yoshinobu Hosoi; Koshi Okamura; Yasuo Kimura; Hisao Ishii; Michio Niwano

doi:10.1016/j.apsusc.2004.10.131

Infrared spectroscopy of pentacene thin film on SiO ₂ surface

Yoshinobu Hosoi, Koshi Okamura, Yasuo Kimura, Hisao Ishii, Michio Niwano

Human Information Systems Division

Research output: Contribution to journal › Conference article › peer-review

31 Citations (Scopus)

Abstract

The thin film of pentacene on a SiO ₂ surface has been investigated by infrared spectroscopy in the multiple internal reflections (MIR) mode. It was found that the molecules in the monolayer are arranged with their molecular axes perpendicular to the surface, and that this arrangement is conserved during film growth up to a 70-nm thickness. In addition, the assignment of the infrared active vibrational modes is discussed.

Original language	English
Pages (from-to)	607-610
Number of pages	4
Journal	Applied Surface Science
Volume	244
Issue number	1-4
DOIs	https://doi.org/10.1016/j.apsusc.2004.10.131
Publication status	Published - 2005 May 15
Event	12th International Conference on Solid Films and Surfaces - Hammatsu, Japan Duration: 2004 Jun 21 → 2004 Jun 25

Keywords

Film structure
Infrared spectroscopy
Pentacene
SiO surface

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2004.10.131

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Infrared spectroscopy of pentacene thin film on SiO ₂ surface . / Hosoi, Yoshinobu; Okamura, Koshi; Kimura, Yasuo; Ishii, Hisao; Niwano, Michio.

In: Applied Surface Science, Vol. 244, No. 1-4, 15.05.2005, p. 607-610.

Research output: Contribution to journal › Conference article › peer-review

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