Infrared emission spectra of CaF2-CaO-SiO2 melt

Shigeru Ueda; Hirotaka Koyo; Takashi Ikeda; Yoshiharu Kariya; Masafumi Maeda

doi:10.2355/isijinternational.40.739

Infrared emission spectra of CaF₂-CaO-SiO₂ melt

Shigeru Ueda, Hirotaka Koyo, Takashi Ikeda, Yoshiharu Kariya, Masafumi Maeda

Center for Mineral Processing and Metallurgy (CMPM)

Research output: Contribution to journal › Article › peer-review

31 Citations (Scopus)

Abstract

The infrared emission spectra of CaF₂-CaO-SiO₂ melt were investigated by a method combining infrared emission spectroscopy and the hot-filament technique. Emission for spectra related to Si-O bond can be observed by this in situ technique. The influence of SiO₂ and fluoride content on the spectrum was investigated, and the emission attributable to bonds corresponding to silicon-bridging oxygen and silicon-non bridging oxygen was discussed. Results suggest that fluoride ion dominantly substitutes for a non-bridging bond in low SiO₂ concentration region. The structure of silicate was compared with calculated infrared emission of Si-F-O.

Original language	English
Pages (from-to)	739-743
Number of pages	5
Journal	Isij International
Volume	40
Issue number	8
DOIs	https://doi.org/10.2355/isijinternational.40.739
Publication status	Published - 2000

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

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title = "Infrared emission spectra of CaF2-CaO-SiO2 melt",

abstract = "The infrared emission spectra of CaF2-CaO-SiO2 melt were investigated by a method combining infrared emission spectroscopy and the hot-filament technique. Emission for spectra related to Si-O bond can be observed by this in situ technique. The influence of SiO2 and fluoride content on the spectrum was investigated, and the emission attributable to bonds corresponding to silicon-bridging oxygen and silicon-non bridging oxygen was discussed. Results suggest that fluoride ion dominantly substitutes for a non-bridging bond in low SiO2 concentration region. The structure of silicate was compared with calculated infrared emission of Si-F-O.",

author = "Shigeru Ueda and Hirotaka Koyo and Takashi Ikeda and Yoshiharu Kariya and Masafumi Maeda",

year = "2000",

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language = "English",

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T1 - Infrared emission spectra of CaF2-CaO-SiO2 melt

AU - Ueda, Shigeru

AU - Koyo, Hirotaka

AU - Ikeda, Takashi

AU - Kariya, Yoshiharu

AU - Maeda, Masafumi

PY - 2000

Y1 - 2000

N2 - The infrared emission spectra of CaF2-CaO-SiO2 melt were investigated by a method combining infrared emission spectroscopy and the hot-filament technique. Emission for spectra related to Si-O bond can be observed by this in situ technique. The influence of SiO2 and fluoride content on the spectrum was investigated, and the emission attributable to bonds corresponding to silicon-bridging oxygen and silicon-non bridging oxygen was discussed. Results suggest that fluoride ion dominantly substitutes for a non-bridging bond in low SiO2 concentration region. The structure of silicate was compared with calculated infrared emission of Si-F-O.

AB - The infrared emission spectra of CaF2-CaO-SiO2 melt were investigated by a method combining infrared emission spectroscopy and the hot-filament technique. Emission for spectra related to Si-O bond can be observed by this in situ technique. The influence of SiO2 and fluoride content on the spectrum was investigated, and the emission attributable to bonds corresponding to silicon-bridging oxygen and silicon-non bridging oxygen was discussed. Results suggest that fluoride ion dominantly substitutes for a non-bridging bond in low SiO2 concentration region. The structure of silicate was compared with calculated infrared emission of Si-F-O.

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