Influence of twist pitch in CICC on contact condition between individual superconducting strands and a copper sleeve in a lap joint

Daisuke Miyagi, Toshiya Morimura, Kazuaki Watanabe, Makoto Tsuda, Takataro Hamajima, Hideki Kajitani, Yoshihiko Nunoya, Norikiyo Koizumi, Kazuya Takahata

Research output: Contribution to journalArticlepeer-review

Abstract

One of the reasons for degradation of the critical current in a Cable-in-conduit conductor is unbalanced current distribution due to inhomogeneous resistance distribution in a lap joint. As a way of solving this problem, a sleeve longer than the highest order sub-cable twist pitch (cable twist pitch) and soldering a joint are actually effective to reduce the inhomogeneity in the resistance distribution between individual strands and the copper sleeve. However, the influence of individual sub-cable twist pitch on contact condition between individual strands and the copper sleeve in a CICC has not been investigated. In this study, the influence of the individual sub-cable twist pitch on contact condition between individual strands and the copper sleeve in a CICC lap joint was investigated using calculated strand paths. Our calculated results show that contact condition between strands and the copper sleeve in a CICC lap joint are improved regardless of the cable configuration when the n-th order sub-cable twist pitch is a multiple of all the previous sub-cables twist pitch. Moreover, it is shown that the difference in the characteristic associated with the contact condition and the combination of sub-cable twist pitch is caused by the cable outline.

Original languageEnglish
Article number6965583
JournalIEEE Transactions on Applied Superconductivity
Volume25
Issue number3
DOIs
Publication statusPublished - 2015 Jun 1

Keywords

  • Cable-in-conduit conductor
  • contact length
  • lap joint
  • strand path
  • twist pitch

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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