Abstract
We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.
Original language | English |
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Title of host publication | Photonics for Solar Energy Systems |
Volume | 6197 |
DOIs | |
Publication status | Published - 2006 Aug 29 |
Event | Photonics for Solar Energy Systems - Strasbourg, France Duration: 2006 Apr 5 → 2006 Apr 6 |
Other
Other | Photonics for Solar Energy Systems |
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Country | France |
City | Strasbourg |
Period | 06/4/5 → 06/4/6 |
Keywords
- Complex refractive index
- Ellipsometry
- High temperature
- RCWA
- Surface grating
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics