Influence of temperature-dependent refractive index on thermal radiation from surface gratings

Hiroo Yugami; Takahiro Kamikawa; Yoshiaki Kanamori

doi:10.1117/12.662760

Influence of temperature-dependent refractive index on thermal radiation from surface gratings

Hiroo Yugami, Takahiro Kamikawa, Yoshiaki Kanamori

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.

Original language	English
Title of host publication	Photonics for Solar Energy Systems
Volume	6197
DOIs	https://doi.org/10.1117/12.662760
Publication status	Published - 2006 Aug 29
Event	Photonics for Solar Energy Systems - Strasbourg, France Duration: 2006 Apr 5 → 2006 Apr 6

Other

Other	Photonics for Solar Energy Systems
Country	France
City	Strasbourg
Period	06/4/5 → 06/4/6

Keywords

Complex refractive index
Ellipsometry
High temperature
RCWA
Surface grating

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

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title = "Influence of temperature-dependent refractive index on thermal radiation from surface gratings",

abstract = "We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.",

keywords = "Complex refractive index, Ellipsometry, High temperature, RCWA, Surface grating",

author = "Hiroo Yugami and Takahiro Kamikawa and Yoshiaki Kanamori",

year = "2006",

month = aug,

day = "29",

doi = "10.1117/12.662760",

language = "English",

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booktitle = "Photonics for Solar Energy Systems",

note = "Photonics for Solar Energy Systems ; Conference date: 05-04-2006 Through 06-04-2006",

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T1 - Influence of temperature-dependent refractive index on thermal radiation from surface gratings

AU - Yugami, Hiroo

AU - Kamikawa, Takahiro

AU - Kanamori, Yoshiaki

PY - 2006/8/29

Y1 - 2006/8/29

N2 - We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.

AB - We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.

KW - Complex refractive index

KW - Ellipsometry

KW - High temperature

KW - RCWA

KW - Surface grating

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DO - 10.1117/12.662760

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Y2 - 5 April 2006 through 6 April 2006

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