Influence of SrRuO3 bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O3 Ultra-thin film capacitor

Takeshi Kawae; Yoshinori Tsukada; Takashi Nakajima; Yuki Terauchi; Yukihiro Nomura; Soichiro Okamura; Akiharu Morimoto

doi:10.1143/JJAP.50.09NA09

Influence of SrRuO₃ bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O₃ Ultra-thin film capacitor

Takeshi Kawae, Yoshinori Tsukada, Takashi Nakajima, Yuki Terauchi, Yukihiro Nomura, Soichiro Okamura, Akiharu Morimoto

Institute for Materials Research (IMR)

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

(Pr,Mn)-codoped BiFeO₃ (BPFM) ultra-thin films of 85nm thickness were deposited on a SrRuO₃ (SRO)-coated (100) Nb-doped SrTiO ₃ substrate by pulsed laser deposition. Regardless of the SRO film thickness, the SRO and BPFM thin films showed perfectly (h00)-orientation on the substrate. On the other hand, the surface morphology and leakage current of the BPFM films strongly depended on the SRO film thickness. The BPFM ultra-thin film on a 115nm thick SRO electrode shows a hysteresis loop without any influences of leakage current. The remnant polarization 2P_r and the coercive voltage 2V_c at the maximum applied voltage of 10 V are 82 μ;C/cm² and 7.2 V, respectively.

Original language	English
Article number	09NA09
Journal	Japanese journal of applied physics
Volume	50
Issue number	9 PART 3
DOIs	https://doi.org/10.1143/JJAP.50.09NA09
Publication status	Published - 2011 Sep

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/JJAP.50.09NA09

Fingerprint Dive into the research topics of 'Influence of SrRuO<sub>3</sub> bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O<sub>3</sub> Ultra-thin film capacitor'. Together they form a unique fingerprint.

Cite this

Influence of SrRuO₃ bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O₃ Ultra-thin film capacitor. / Kawae, Takeshi; Tsukada, Yoshinori; Nakajima, Takashi; Terauchi, Yuki; Nomura, Yukihiro; Okamura, Soichiro; Morimoto, Akiharu.

In: Japanese journal of applied physics, Vol. 50, No. 9 PART 3, 09NA09, 09.2011.

Research output: Contribution to journal › Article › peer-review

@article{902aaac801734f649c824dd482e62026,

title = "Influence of SrRuO3 bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O3 Ultra-thin film capacitor",

abstract = "(Pr,Mn)-codoped BiFeO3 (BPFM) ultra-thin films of 85nm thickness were deposited on a SrRuO3 (SRO)-coated (100) Nb-doped SrTiO 3 substrate by pulsed laser deposition. Regardless of the SRO film thickness, the SRO and BPFM thin films showed perfectly (h00)-orientation on the substrate. On the other hand, the surface morphology and leakage current of the BPFM films strongly depended on the SRO film thickness. The BPFM ultra-thin film on a 115nm thick SRO electrode shows a hysteresis loop without any influences of leakage current. The remnant polarization 2Pr and the coercive voltage 2Vc at the maximum applied voltage of 10 V are 82 μ;C/cm2 and 7.2 V, respectively.",

author = "Takeshi Kawae and Yoshinori Tsukada and Takashi Nakajima and Yuki Terauchi and Yukihiro Nomura and Soichiro Okamura and Akiharu Morimoto",

year = "2011",

month = sep,

doi = "10.1143/JJAP.50.09NA09",

language = "English",

volume = "50",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "9 PART 3",

}

TY - JOUR

T1 - Influence of SrRuO3 bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O3 Ultra-thin film capacitor

AU - Kawae, Takeshi

AU - Tsukada, Yoshinori

AU - Nakajima, Takashi

AU - Terauchi, Yuki

AU - Nomura, Yukihiro

AU - Okamura, Soichiro

AU - Morimoto, Akiharu

PY - 2011/9

Y1 - 2011/9

N2 - (Pr,Mn)-codoped BiFeO3 (BPFM) ultra-thin films of 85nm thickness were deposited on a SrRuO3 (SRO)-coated (100) Nb-doped SrTiO 3 substrate by pulsed laser deposition. Regardless of the SRO film thickness, the SRO and BPFM thin films showed perfectly (h00)-orientation on the substrate. On the other hand, the surface morphology and leakage current of the BPFM films strongly depended on the SRO film thickness. The BPFM ultra-thin film on a 115nm thick SRO electrode shows a hysteresis loop without any influences of leakage current. The remnant polarization 2Pr and the coercive voltage 2Vc at the maximum applied voltage of 10 V are 82 μ;C/cm2 and 7.2 V, respectively.

AB - (Pr,Mn)-codoped BiFeO3 (BPFM) ultra-thin films of 85nm thickness were deposited on a SrRuO3 (SRO)-coated (100) Nb-doped SrTiO 3 substrate by pulsed laser deposition. Regardless of the SRO film thickness, the SRO and BPFM thin films showed perfectly (h00)-orientation on the substrate. On the other hand, the surface morphology and leakage current of the BPFM films strongly depended on the SRO film thickness. The BPFM ultra-thin film on a 115nm thick SRO electrode shows a hysteresis loop without any influences of leakage current. The remnant polarization 2Pr and the coercive voltage 2Vc at the maximum applied voltage of 10 V are 82 μ;C/cm2 and 7.2 V, respectively.

UR - http://www.scopus.com/inward/record.url?scp=80053057347&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80053057347&partnerID=8YFLogxK

U2 - 10.1143/JJAP.50.09NA09

DO - 10.1143/JJAP.50.09NA09

M3 - Article

AN - SCOPUS:80053057347

VL - 50

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 9 PART 3

M1 - 09NA09