Influence of SrRuO3 bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O3 Ultra-thin film capacitor

Takeshi Kawae, Yoshinori Tsukada, Takashi Nakajima, Yuki Terauchi, Yukihiro Nomura, Soichiro Okamura, Akiharu Morimoto

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7 Citations (Scopus)

Abstract

(Pr,Mn)-codoped BiFeO3 (BPFM) ultra-thin films of 85nm thickness were deposited on a SrRuO3 (SRO)-coated (100) Nb-doped SrTiO 3 substrate by pulsed laser deposition. Regardless of the SRO film thickness, the SRO and BPFM thin films showed perfectly (h00)-orientation on the substrate. On the other hand, the surface morphology and leakage current of the BPFM films strongly depended on the SRO film thickness. The BPFM ultra-thin film on a 115nm thick SRO electrode shows a hysteresis loop without any influences of leakage current. The remnant polarization 2Pr and the coercive voltage 2Vc at the maximum applied voltage of 10 V are 82 μ;C/cm2 and 7.2 V, respectively.

Original languageEnglish
Article number09NA09
JournalJapanese journal of applied physics
Volume50
Issue number9 PART 3
DOIs
Publication statusPublished - 2011 Sep 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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    Kawae, T., Tsukada, Y., Nakajima, T., Terauchi, Y., Nomura, Y., Okamura, S., & Morimoto, A. (2011). Influence of SrRuO3 bottom electrode thickness on electric properties of (Bi,Pr)(Fe,Mn)O3 Ultra-thin film capacitor. Japanese journal of applied physics, 50(9 PART 3), [09NA09]. https://doi.org/10.1143/JJAP.50.09NA09