In situ study of hydriding-dehydriding properties in some Pd/Mg thin films with different degree of Mg crystallization

K. Higuchi, H. Kajioka, K. Toiyama, H. Fujii, S. Orimo, Y. Kikuchi

Research output: Contribution to journalConference article

112 Citations (Scopus)

Abstract

A new in situ system with the functions of thin film formation and analysis of hydrogen absorption-desorption properties has been developed to clarify hydrogen storage properties in nano-scaled composites. In this work, some Pd/Mg films (Pd (25 nm)-coated Mg (200 nm) films) with different degree of crystallization in the Mg layer were prepared in different sputtering conditions by changing RF coil powers and argon pressures. Hydrogenation under hydrogen gas pressure of 0.1 MPa at 373 K for 24 h indicated that MgH2 and non-crystalline Mg hydrides were formed in all the Pd/Mg films and the hydrogen content reached 2.9 to approximately 6.6 mass% independent of the degree of Mg crystallization. From the thermal desorption spectrum, it was deduced that the dehydriding temperature decreased with decreasing the degree of crystallization in the Mg layer in Pd/Mg films and the Pd/Mg film with lowest crystallization absorbed 5.6 mass% of hydrogen and all the hydrogen desorbed at a temperature lower than 463 K in vacuum.

Original languageEnglish
Pages (from-to)484-489
Number of pages6
JournalJournal of Alloys and Compounds
Volume293
DOIs
Publication statusPublished - 1999 Dec 20
Externally publishedYes
EventProceedings of the 1998 International Symposium on Metal-Hydrogen Systems - Fundamentals and Applications (MH98) - Hangzhou, China
Duration: 1998 Oct 41998 Oct 9

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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