In situ Raman spectroscopy observation of crystallization process of sol-gel derived Bi4-xLaxTi3O12 films

Naoki Sugita, Eisuke Tokumitsu, Minoru Osada, Masato Kakihana

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    37 Citations (Scopus)

    Abstract

    In situ Raman spectra measurements have been employed to reveal the crystallization process of sol-gel derived Bi4-xLaxTi3O12 (BLT) thin films. The Raman spectra of BLT films with a La composition x of 0.75 were measured with increasing temperature up to 800°C in air and N2 ambient. It is demonstrated that Bi2O2 layered structures form first at 500°C and perovskite structures start to crystallize at 600°C or higher.

    Original languageEnglish
    Pages (from-to)L944-L945
    JournalJapanese Journal of Applied Physics, Part 2: Letters
    Volume42
    Issue number8 A
    DOIs
    Publication statusPublished - 2003 Aug 1

    Keywords

    • Bismuth titanate
    • Crystallization
    • Ferroelectrics
    • Raman spectra
    • Thin films

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy (miscellaneous)
    • Physics and Astronomy(all)

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