In-situ polarization-dependent total-reflection fluorescence XAFS studies on the structure transformation of Pt clusters on α-Al2O3(0001)

Kiyotaka Asakura, Wang Jae Chun, Masayuki Shirai, Keiichi Tomishige, Yasuhiro Iwasawa

Research output: Contribution to journalArticlepeer-review

46 Citations (Scopus)

Abstract

Structures of Pt species derived from Pt4(μ-CH3COO)8 on an α-Al2O3(0001) single-crystal surface were studied by means of in-situ polarization-dependent total reflection fluorescence XAFS (EXAFS and XANES) techniques. The Pt4 cluster framework was destroyed upon the deposition of Pt4(μ-CH3COO)8 by the reaction on the α-Al2O3 surface at room temperature. The isolated Pt species were converted to one-atomic layer thick Pt rafts with the Pt-Pt distance of 0.273 nm when the cluster was treated with H2 at 373 K. The raftlike Pt clusters were stabilized by the formation of direct Pt-O-Al bonding with the α-Al2O3 surface. The raftlike Pt clusters were redispersed to isolated oxidized Pt species by the reaction with NO. They were also transferred to three-dimensional Pt particles by reduction with H2 at 773 K.

Original languageEnglish
Pages (from-to)5549-5556
Number of pages8
JournalJournal of Physical Chemistry B
Volume101
Issue number28
Publication statusPublished - 1997 Jul 10
Externally publishedYes

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'In-situ polarization-dependent total-reflection fluorescence XAFS studies on the structure transformation of Pt clusters on α-Al<sub>2</sub>O<sub>3</sub>(0001)'. Together they form a unique fingerprint.

Cite this