In situ observation of grain growth on electroplated cu film by electron backscatter diffraction

Takenao Nemoto, Tatsuya Fukino, Sadahiro Tsurekawa, Xun Gu, Akinobu Teramoto, Tadahiro Ohmi

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Fingerprint

Dive into the research topics of 'In situ observation of grain growth on electroplated cu film by electron backscatter diffraction'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy