In Situ observation of dislocation behavior in nanometer grains

Lihua Wang, Xiaodong Han, Pan Liu, Yonghai Yue, Ze Zhang, En Ma

    Research output: Contribution to journalArticlepeer-review

    124 Citations (Scopus)

    Abstract

    Using a newly developed nanoscale deformation device, atomic scale and time-resolved dislocation dynamics have been captured in situ under a transmission electron microscope during the deformation of a Pt ultrathin film with truly nanometer grains (diameter d<∼10nm). We demonstrate that dislocations are highly active even in such tiny grains. For the larger grains (d∼10nm), full dislocations dominate and their evolution sometimes leads to the formation, destruction, and reformation of Lomer locks. In smaller grains, partial dislocations generating stacking faults are prevalent.

    Original languageEnglish
    Article number135501
    JournalPhysical review letters
    Volume105
    Issue number13
    DOIs
    Publication statusPublished - 2010 Sep 20

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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