In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates

Genki Yoshikawa, Tetsuhiko Miyadera, Ryo Onoki, Keiji Ueno, Ikuyo Nakai, Shiro Entani, Susumu Ikeda, Dong Guo, Manabu Kiguchi, Hiroshi Kondoh, Toshiaki Ohta, Koichiro Saiki

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