In situ investigation of annealing effect on lamellar stacking structure of polyethylene thin films by synchrotron grazing-incidence small-angle and wide-angle X-ray scattering

Sono Sasaki, Hiroyasu Masunaga, Hiroo Tajiri, Katsuaki Inoue, Hiroshi Okuda, Hiromichi Noma, Kohji Honda, Atsushi Takahara, Masaki Takata

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