Abstract
We have]] in situ" investigated the chemistry of Si(100) surfaces during immersion in hydrofluoric acid (HF) solution, using infrared spectroscopy in the multiple internal reflection geometry. During immersion in dilute HF solution, hydrogen termination is not completed and hydrogen-associated Si fluorides may be generated on the surface. We demonstrate that water rinse following treatment with HF solution leads to the complete hydrogen termination of Si surfaces.
Original language | English |
---|---|
Pages (from-to) | 1692-1694 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 65 |
Issue number | 13 |
DOIs | |
Publication status | Published - 1994 Dec 1 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)