In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al

Susumu Tsukimoto, S. Arai, M. Konno, T. Kamino, K. Sasaki, H. Saka

    Research output: Contribution to journalArticlepeer-review

    12 Citations (Scopus)

    Abstract

    Electron energy loss spectroscopy was used to observe the segregation of Al on a Si surface above the melting point of Al. A mixture of Al and Si particles was heated above the melting point of Al in a vacuum of 1 × 10-5 Pa. The Si surface, which initially had been covered with an amorphous oxide layer before heating, became clean and atomically facetted when the Al melted. It was shown that the Si surface was segregated with Al.

    Original languageEnglish
    Pages (from-to)17-21
    Number of pages5
    JournalJournal of Microscopy
    Volume203
    Issue number1
    DOIs
    Publication statusPublished - 2001 Aug 6

    Keywords

    • EELS
    • In-situ heating experiment
    • Si surface
    • Wetting by liquid metals

    ASJC Scopus subject areas

    • Pathology and Forensic Medicine
    • Histology

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