In situ evaluation method for on-chip inductors using oscillator response

Mizuki Motoyoshi, Minora Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

It is difficult to obtain the characteristics of on-chip inductors on site since conventional evaluation requires dedicated test devices. In this paper, in-situ evaluation of both inductance and resistance of on-chip inductors Without dedicated test devices is proposed, where on-chip inductors are evaluated on the basis of the threshold current for oscillation and oscillation frequency without being affected by lead Wires. The proposed method was verified by measurement, and it is found that the error against the evaluation result using a network analyzer is less than 3%.

Original languageEnglish
Title of host publicationProceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Pages369-372
Number of pages4
DOIs
Publication statusPublished - 2006 Dec 1
Externally publishedYes
EventIEEE 2006 Custom Integrated Circuits Conference, CICC 2006 - San Jose, CA, United States
Duration: 2006 Sep 102006 Sep 13

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Other

OtherIEEE 2006 Custom Integrated Circuits Conference, CICC 2006
CountryUnited States
CitySan Jose, CA
Period06/9/1006/9/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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