IN SITU ANALYSIS OF PASSIVE FILMS ON Ni-Cr ALLOYS BY MODULATED UV-VISIBLE REFLECTION SPECTROSCOPY.

Nobuyoshi Hara, Naobumi Saito, Katsuhisa Sugimoto

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Modulated reflection spectra of passive films on a series of Ni-Cr alloys (5 to 28 mass% Cr) have been measured in 1 kmol multiplied by (times) m** minus **3 Na//2SO//4 of pH 6. 0. Quantitaive relations between the characteristics of spectra and the composition of the films have been derived from spectra for thin composite films of NiO-Cr//2O//3 artificially prepared on Pt by MO-CVD technique. From these relations, cationic mass fractions of Cr**3** plus ions, X//C//r, of passive films on the alloys were determined. It was found that passive films on the alloys were composed of Ni(II) and Cr(III) oxides, and that their cationic fractions of Cr**3** plus ions changed remarkably with the Cr content of the alloy. That is, the values of X//C//r for the films formed at 0. 10 v increased from 0. 10 for Ni-5 mass% Cr alloy to 0. 88 for Ni-28 mass% Cr alloy with increasing Cr content of the alloy. This indicates that Cr**3** plus ions were substantially enriched in the films on the alloys containing more than 15 mass% Cr. The value of X//C//r for each alloy was almost independent of the potential in the passivity region below 0. 5 v.

Original languageEnglish
Pages (from-to)10-17
Number of pages8
JournalBoshoku gijutsu
Volume35
Issue number1
DOIs
Publication statusPublished - 1986 Jan 1

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'IN SITU ANALYSIS OF PASSIVE FILMS ON Ni-Cr ALLOYS BY MODULATED UV-VISIBLE REFLECTION SPECTROSCOPY.'. Together they form a unique fingerprint.

Cite this