In-plane distribution of phase transition temperature of KTa 1-xNbxO3 measured with single temperature sweep

Takashi Sakamoto; Masahiro Sasaura; Shogo Yagi; Kazuo Fujiura; Yasuo Cho

doi:10.1143/APEX.1.101601

In-plane distribution of phase transition temperature of KTa 1-xNbxO3 measured with single temperature sweep

Takashi Sakamoto, Masahiro Sasaura, Shogo Yagi, Kazuo Fujiura, Yasuo Cho

Information Devices Division

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

We demonstrate that the paraelectric to ferroelectric phase transition temperature T_C distribution of KTa_1-xNb_xO ₃ (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The T_C measurement precision (standard deviation) is estimated to be 0.05°C, where the standard deviation is defined as [σ_i=1²⁰σ _j=1⁴(T_C-ij -T̄_C-1) ²/(4× 20 - 1)]^1/2, in which T_C-ijis the T_C value at point i measured in the jth trial, and T̄ _{C- i}s the trial average of T_C at point.

Original language	English
Pages (from-to)	1016011-1016013
Number of pages	3
Journal	Applied Physics Express
Volume	1
Issue number	10
DOIs	https://doi.org/10.1143/APEX.1.101601
Publication status	Published - 2008 Oct 1

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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@article{009eb62ba56345199a7b779ff5662a78,

title = "In-plane distribution of phase transition temperature of KTa 1-xNbxO3 measured with single temperature sweep",

abstract = "We demonstrate that the paraelectric to ferroelectric phase transition temperature TC distribution of KTa1-xNbxO 3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The TC measurement precision (standard deviation) is estimated to be 0.05°C, where the standard deviation is defined as [σi=120σ j=14(TC-ij -{\=T}C-1) 2/(4× 20 - 1)]1/2, in which TC-ijis the TC value at point i measured in the jth trial, and {\=T} C- is the trial average of TC at point.",

author = "Takashi Sakamoto and Masahiro Sasaura and Shogo Yagi and Kazuo Fujiura and Yasuo Cho",

year = "2008",

month = oct,

day = "1",

doi = "10.1143/APEX.1.101601",

language = "English",

volume = "1",

pages = "1016011--1016013",

journal = "Applied Physics Express",

issn = "1882-0778",

publisher = "Japan Society of Applied Physics",

number = "10",

}

TY - JOUR

T1 - In-plane distribution of phase transition temperature of KTa 1-xNbxO3 measured with single temperature sweep

AU - Sakamoto, Takashi

AU - Sasaura, Masahiro

AU - Yagi, Shogo

AU - Fujiura, Kazuo

AU - Cho, Yasuo

PY - 2008/10/1

Y1 - 2008/10/1

N2 - We demonstrate that the paraelectric to ferroelectric phase transition temperature TC distribution of KTa1-xNbxO 3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The TC measurement precision (standard deviation) is estimated to be 0.05°C, where the standard deviation is defined as [σi=120σ j=14(TC-ij -T̄C-1) 2/(4× 20 - 1)]1/2, in which TC-ijis the TC value at point i measured in the jth trial, and T̄ C- is the trial average of TC at point.

AB - We demonstrate that the paraelectric to ferroelectric phase transition temperature TC distribution of KTa1-xNbxO 3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The TC measurement precision (standard deviation) is estimated to be 0.05°C, where the standard deviation is defined as [σi=120σ j=14(TC-ij -T̄C-1) 2/(4× 20 - 1)]1/2, in which TC-ijis the TC value at point i measured in the jth trial, and T̄ C- is the trial average of TC at point.

UR - http://www.scopus.com/inward/record.url?scp=57649092304&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=57649092304&partnerID=8YFLogxK

U2 - 10.1143/APEX.1.101601

DO - 10.1143/APEX.1.101601

M3 - Article

AN - SCOPUS:57649092304

SN - 1882-0778

VL - 1

SP - 1016011

EP - 1016013

JO - Applied Physics Express

JF - Applied Physics Express

IS - 10

ER -

In-plane distribution of phase transition temperature of KTa 1-xNbxO3 measured with single temperature sweep

Abstract

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