In-plane distribution of phase transition temperature of KTa 1-xNbxO3 measured with single temperature sweep

Takashi Sakamoto, Masahiro Sasaura, Shogo Yagi, Kazuo Fujiura, Yasuo Cho

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

We demonstrate that the paraelectric to ferroelectric phase transition temperature TC distribution of KTa1-xNbxO 3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The TC measurement precision (standard deviation) is estimated to be 0.05°C, where the standard deviation is defined as [σi=120σ j=14(TC-ij -T̄C-1) 2/(4× 20 - 1)]1/2, in which TC-ijis the TC value at point i measured in the jth trial, and T̄ C- is the trial average of TC at point.

Original languageEnglish
Pages (from-to)1016011-1016013
Number of pages3
JournalApplied Physics Express
Volume1
Issue number10
DOIs
Publication statusPublished - 2008 Oct 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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