We demonstrate that the paraelectric to ferroelectric phase transition temperature TC distribution of KTa1-xNbxO 3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The TC measurement precision (standard deviation) is estimated to be 0.05°C, where the standard deviation is defined as [σi=120σ j=14(TC-ij -T̄C-1) 2/(4× 20 - 1)]1/2, in which TC-ijis the TC value at point i measured in the jth trial, and T̄ C- is the trial average of TC at point.
ASJC Scopus subject areas
- Physics and Astronomy(all)