Abstract
The effect of in-plane lattice matching on the magnetic and read/write properties has been quantitatively studied in CoCr24Pt12B4 or CoCr20Pt8Ta4 media grown on Cr, CrMo20 and CrMo20/Cr underlayer. It is found that by using CrMo20 (5 nm)/Cr (5 nm) dual underlayer, significant improvement of magnetic and R/W properties are realized. It is clarified that: (1) the utilization of CrMo/Cr dual underlayer increases HC mainly due to the improvement of in-plane crystallographic orientation; (2) the lattice misfit has small effect on the improvement of in-plane crystallographic orientation. The improvement of in-plane crystallographic orientation by using CrX/Cr dual underlayer is suggested to be due to lattice strain at the interface of Cr and CrX underlayer, which enhances the grain growth of the magnetic layer.
Original language | English |
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Pages (from-to) | 1497-1499 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 37 |
Issue number | 4 I |
DOIs | |
Publication status | Published - 2001 Jul |
Externally published | Yes |
Event | 8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag) - San Antonio, TX, United States Duration: 2001 Jan 7 → 2001 Jan 11 |
Keywords
- Dual underlayer
- In-plane XRD
- Lattice misfit
- Longitudinal media
- Thin film
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering