Improvement of magnetic and R/W properties in longitudinal media by using CrX/Cr dual underlayer

D. D. Djayaprawira, A. Horii, K. Komiyama, S. Yoshimura, M. Mikami, H. Domon, M. Takahashi

    Research output: Contribution to journalConference articlepeer-review

    9 Citations (Scopus)

    Abstract

    The effect of in-plane lattice matching on the magnetic and read/write properties has been quantitatively studied in CoCr24Pt12B4 or CoCr20Pt8Ta4 media grown on Cr, CrMo20 and CrMo20/Cr underlayer. It is found that by using CrMo20 (5 nm)/Cr (5 nm) dual underlayer, significant improvement of magnetic and R/W properties are realized. It is clarified that: (1) the utilization of CrMo/Cr dual underlayer increases HC mainly due to the improvement of in-plane crystallographic orientation; (2) the lattice misfit has small effect on the improvement of in-plane crystallographic orientation. The improvement of in-plane crystallographic orientation by using CrX/Cr dual underlayer is suggested to be due to lattice strain at the interface of Cr and CrX underlayer, which enhances the grain growth of the magnetic layer.

    Original languageEnglish
    Pages (from-to)1497-1499
    Number of pages3
    JournalIEEE Transactions on Magnetics
    Volume37
    Issue number4 I
    DOIs
    Publication statusPublished - 2001 Jul 1
    Event8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag) - San Antonio, TX, United States
    Duration: 2001 Jan 72001 Jan 11

    Keywords

    • Dual underlayer
    • In-plane XRD
    • Lattice misfit
    • Longitudinal media
    • Thin film

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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