Improvement of Ic by loading and unloading bending strain for high strength Nb3Sn wires

Satoshi Awaji, Hidetoshi Oguro, Gen Nishijima, Kazuo Watanabe, Kazumune Katagiri, Kazutomi Miyoshi, Shin Ichiro Meguro

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

We investigated the influence of the repeated bending strain on the critical current properties. The bending strain was applied to the Ti added high strength CuNb/Nb3Sn wires at room temperature and released. We define this loading and unloading bending strain at room temperature as a "pre-bending" treatment. We found that the critical current I c is much enhanced by applying the pre-bending treatment. The maximum enhancement of Ic due to the pre-bending treatment is about twice at 17 T, for instance. The stress dependence of Ic shows that I c is unproved in low stress states by pre-bending treatment. This phenomenon can be described well by the uniaxial strain analysis on the basis of the strain distribution. In addition, the increase of the maximum critical current of the strain dependent Ic is also observed. This may be related to the reduction of the radial/tangential prestrain.

Original languageEnglish
Pages (from-to)983-986
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume14
Issue number2
DOIs
Publication statusPublished - 2004 Jun

Keywords

  • Bending strain
  • Critical current
  • NbSn
  • Tansile strain

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Improvement of I<sub>c</sub> by loading and unloading bending strain for high strength Nb<sub>3</sub>Sn wires'. Together they form a unique fingerprint.

Cite this