Improvement of Fresnel zone plate beam-profile monitor and application to ultralow emittance beam profile measurements

Hiroshi Sakai, Masami Fujisawa, Kensuke Iida, Isao Ito, Hirofumi Kudo, Norio Nakamura, Kenji Shinoe, Takeo Tanaka, Hitoshi Hayano, Masao Kuriki, Toshiya Muto

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)


We describe the improvements of a Fresnel zone plate (FZP) beam-profile monitor, which is being developed at the KEK-ATF damping ring to measure ultralow emittance electron-beam profiles. This monitor, which is designed to have a submicrometer spatial resolution, is based on x-ray imaging optics composed of two FZPs. Various improvements were performed to the old setup. First, a new crystal monochromator was introduced to suppress the beam image drift. Second, the two FZP folders were improved in order to realize a precise beam-based alignment during x-ray imaging. Third, a fast mechanical shutter was installed to achieve a shorter time resolution, and an x-ray mask system was also installed to obstruct direct synchrotron radiation through the FZPs. These improvements could make beam-profile measurements more precise and reliable. The beam profiles with less than 50 μm horizontal beam size and less than 6 μm vertical beam size could be measured within a 1 ms time duration. Furthermore, measurements of the damping time and the coupling dependence of the ATF damping ring were successfully carried out with this upgraded FZP monitor.

Original languageEnglish
Article number042801
JournalPhysical Review Special Topics - Accelerators and Beams
Issue number4
Publication statusPublished - 2007 Apr 30

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Physics and Astronomy (miscellaneous)
  • Surfaces and Interfaces


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