Impact of FinFET technology on 6T-SRAM performance

S. O'uchi, T. Nakagawa, T. Matsukawa, Y. X. Liu, K. Endo, T. Sekigawa, K. Sakamoto, H. Koike, M. Masahara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2009 IEEE International SOI Conference
DOIs
Publication statusPublished - 2009 Dec 28
Externally publishedYes
Event2009 IEEE International SOI Conference - Foster City, CA, United States
Duration: 2009 Oct 52009 Oct 8

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X

Other

Other2009 IEEE International SOI Conference
CountryUnited States
CityFoster City, CA
Period09/10/509/10/8

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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