Imaging with a longitudinal electric field in confocal laser scanning microscopy to enhance spatial resolution

Yuichi Kozawa, Ryota Sakashita, Yuuki Uesugi, Shunichi Sato

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The longitudinal electric field produced by focusing a radially polarized beam is applied in confocal laser scanning microscopy by introducing a higher-order transverse mode, combined with a technique of polarization conversion for signal detection. This technique improves signal detection corresponding to the longitudinally polarized field under a small confocal pinhole, enabling full utilization of the small focal spot characteristic of the longitudinal field. Detailed numerical and experimental studies demonstrate the enhanced spatial resolution in confocal imaging that detects a scattering signal using a higher-order radially polarized beam. Our method can be widely applied in various imaging techniques that detect coherent signals such as second-harmonic generation microscopy.

Original languageEnglish
Pages (from-to)18418-18430
Number of pages13
JournalOptics Express
Volume28
Issue number12
DOIs
Publication statusPublished - 2020 Jun 8

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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