Imaging of piezoelectric activity in laser-ablated c-axis-oriented LiNbO3/ZnO thin film multilayer on glass using atomic force microscopy

Parmanand Sharma, K. Sreenivas, L. M. Belova, K. V. Rao

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

A LiNbO3/ZnO multilayer with a preferred c-axis orientation normal to the plane of the substrate was grown on glass and SiO2/Si substrates by laser ablation. The piezoelectric activity in as-deposited films was demonstrated using a novel approach to the atomic force microscope. In the presence of an in-plane, low-frequency (0.1-5 Hz) alternating current electric field, we monitored and imaged the induced piezoelectric response normal to the film plane between two electrodes.

Original languageEnglish
Pages (from-to)2025-2028
Number of pages4
JournalJournal of Materials Research
Volume18
Issue number9
DOIs
Publication statusPublished - 2003 Sep
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Imaging of piezoelectric activity in laser-ablated c-axis-oriented LiNbO<sub>3</sub>/ZnO thin film multilayer on glass using atomic force microscopy'. Together they form a unique fingerprint.

Cite this