Imaging of current concentration in sub-linear width dependent quantum Hall breakdown

K. Oto, T. Katagiri, M. Dohi, R. Yonamine, T. Ishihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have investigated the current distribution at quantum Hall effect (QHE) plateau to study mechanisms of the QHE breakdown whose critical current shows sub-linear dependence on the channel width. A Hall-bar device made from GaAs/AlGaAs on a scanning stage is locally illuminated by an infrared laser light to map the QHE breakdown critical current with local photo-excitation. The spatial profile of the critical current reveals the current concentration at the center region of the sample.

Original languageEnglish
Title of host publicationPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
Pages661-662
Number of pages2
DOIs
Publication statusPublished - 2007 Dec 1
Externally publishedYes
Event28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
Duration: 2006 Jul 242006 Jul 28

Publication series

NameAIP Conference Proceedings
Volume893
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other28th International Conference on the Physics of Semiconductors, ICPS 2006
CountryAustria
CityVienna
Period06/7/2406/7/28

Keywords

  • Breakdown
  • Current concentration
  • Quantum Hall effect

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Oto, K., Katagiri, T., Dohi, M., Yonamine, R., & Ishihara, T. (2007). Imaging of current concentration in sub-linear width dependent quantum Hall breakdown. In Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B (pp. 661-662). (AIP Conference Proceedings; Vol. 893). https://doi.org/10.1063/1.2730064