The high resolution noncontact atomic force microscopy (AFM) was used for the true imaging of all dangling bonds and their potential on the Ge/Si(105) surface. Use of Kelvin-probe force microscopy (KFM) with AFM, revealed potential variations among the dangling bond states, directly monitoring a charge transfer between them. It was observed that high resolution non-contact AFM is more advantageous than scanning tunneling microscopy, whose images strongly deviated from the atomic structure by the electronic states involved. The combined high resolution noncontact AFM and Kelvin-probe method was found to be an ideal analytical tool for atomic structures and electronic properties of surfaces.
ASJC Scopus subject areas
- Physics and Astronomy(all)