Image observation of diffraction spots using FZP and coherent X-ray beam

Takuya Suzuki, Hidekazu Takano, Akihisa Takeuchi, Kentaro Uesugi, Yoshiki Kohmura, Masashi Hasegawa, Kazuharu Yoshizuka, Yoshio Suzuki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

New small angle X-ray dispersion speckle method by the condensing optical system using FZP (Fresnel zone plate) was performed. And single crystal diffraction spot image was observed using this optical system. High photon flux with the FZP of 100-micron-diameter is obtained than that with a 5-micron-diameter pinhole. S/N ratio of data improved and measurement time also became short. The minimum beam size focused with the FZP was 0.25 μm. The speckle image resulting from the non-ordering structure and periodic structure of 10nm order is successfully observed. This optical system was applicable also to diffraction spot image observation. We show a possibility that the information of the periodic and/or random structural analysis with sub-μm order which were unsuitable with the conventional single crystal x-ray diffraction analysis.

Original languageEnglish
Title of host publicationSynchrotron Radiation Instrumentation
Subtitle of host publication8th International Conference on Synchrotron Radiation Instrumentation
PublisherAmerican Institute of Physics Inc.
Pages1332-1335
Number of pages4
ISBN (Electronic)0735401799
DOIs
Publication statusPublished - 2004 May 12
Externally publishedYes
Event8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
Duration: 2003 Aug 252003 Aug 29

Publication series

NameAIP Conference Proceedings
Volume705
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period03/8/2503/8/29

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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