Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato, Teruyasu Mizoguchi, Fumiyasu Oba, Masatada Yodogawa, Takahisa Yamamoto, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    32 Citations (Scopus)

    Abstract

    Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

    Original languageEnglish
    Pages (from-to)5311-5313
    Number of pages3
    JournalApplied Physics Letters
    Volume84
    Issue number26
    DOIs
    Publication statusPublished - 2004 Jun 28

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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