Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato; Teruyasu Mizoguchi; Fumiyasu Oba; Masatada Yodogawa; Takahisa Yamamoto; Yuichi Ikuhara

doi:10.1063/1.1766078

Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato, Teruyasu Mizoguchi, Fumiyasu Oba, Masatada Yodogawa, Takahisa Yamamoto, Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

32 Citations (Scopus)

Abstract

Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

Original language	English
Pages (from-to)	5311-5313
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	26
DOIs	https://doi.org/10.1063/1.1766078
Publication status	Published - 2004 Jun 28

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.1766078

Fingerprint Dive into the research topics of 'Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations'. Together they form a unique fingerprint.

Cite this

Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations. / Sato, Yukio; Mizoguchi, Teruyasu; Oba, Fumiyasu; Yodogawa, Masatada; Yamamoto, Takahisa; Ikuhara, Yuichi.

In: Applied Physics Letters, Vol. 84, No. 26, 28.06.2004, p. 5311-5313.

Research output: Contribution to journal › Article › peer-review

@article{590e7033524e47fea18a2f1eadbc7d1a,

title = "Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations",

abstract = "Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.",

author = "Yukio Sato and Teruyasu Mizoguchi and Fumiyasu Oba and Masatada Yodogawa and Takahisa Yamamoto and Yuichi Ikuhara",

year = "2004",

month = jun,

day = "28",

doi = "10.1063/1.1766078",

language = "English",

volume = "84",

pages = "5311--5313",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "26",

}

TY - JOUR

T1 - Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

AU - Sato, Yukio

AU - Mizoguchi, Teruyasu

AU - Oba, Fumiyasu

AU - Yodogawa, Masatada

AU - Yamamoto, Takahisa

AU - Ikuhara, Yuichi

PY - 2004/6/28

Y1 - 2004/6/28

N2 - Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

AB - Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

UR - http://www.scopus.com/inward/record.url?scp=3242655670&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=3242655670&partnerID=8YFLogxK

U2 - 10.1063/1.1766078

DO - 10.1063/1.1766078

M3 - Article

AN - SCOPUS:3242655670

VL - 84

SP - 5311

EP - 5313

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 26

ER -