Abstract
Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.
Original language | English |
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Pages (from-to) | 5311-5313 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 26 |
DOIs | |
Publication status | Published - 2004 Jun 28 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)