Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato; Teruyasu Mizoguchi; Fumiyasu Oba; Masatada Yodogawa; Takahisa Yamamoto; Yuichi Ikuhara

doi:10.1063/1.1766078

Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato, Teruyasu Mizoguchi, Fumiyasu Oba, Masatada Yodogawa, Takahisa Yamamoto, Yuichi Ikuhara

Research output: Contribution to journal › Article › peer-review

32 Citations (Scopus)

Abstract

Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

Original language	English
Pages (from-to)	5311-5313
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	26
DOIs	https://doi.org/10.1063/1.1766078
Publication status	Published - 2004 Jun 28

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1766078

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Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations. / Sato, Yukio; Mizoguchi, Teruyasu; Oba, Fumiyasu; Yodogawa, Masatada; Yamamoto, Takahisa; Ikuhara, Yuichi.

In: Applied Physics Letters, Vol. 84, No. 26, 28.06.2004, p. 5311-5313.

Research output: Contribution to journal › Article › peer-review

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title = "Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations",

abstract = "Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.",

author = "Yukio Sato and Teruyasu Mizoguchi and Fumiyasu Oba and Masatada Yodogawa and Takahisa Yamamoto and Yuichi Ikuhara",

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AU - Sato, Yukio

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AU - Oba, Fumiyasu

AU - Yodogawa, Masatada

AU - Yamamoto, Takahisa

AU - Ikuhara, Yuichi

N1 - Funding Information: This study was financially supported by a Grant-in-Aid for Scientific Research and Special Coordination Funds from the Ministry of Education, Culture, Sports, Science, and Technology, and Japan Society of Promotion of Science,(JSPS) Japan. Three of the authors (Y.S., T.M., and F.O.) are supported as the JSPS fellowship.

PY - 2004/6/28

Y1 - 2004/6/28

N2 - Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

AB - Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

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Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

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