Identification of nanometer-scale compositional fluctuations in silicate glass using electron microscopy and spectroscopy

Katsuaki Nakazawa, Tomohiro Miyata, Shin ichi Amma, Teruyasu Mizoguchi

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Silicate glasses are indispensable for optical and photonics applications, and their properties are affected by phase-separated structures. Understanding the phase separation behavior inside the glasses is thus crucial for controlling their optical properties. Here, we attempt to identify the phase-separated structure inside silicate glass by high-angular annular dark field-scanning transmission electron microscopy (HAADF-STEM) combined with a multi-slice image simulation. In addition to the phase-separated structure, we also demonstrate that the identifications of the type and stage of the phase-separation are possible by the HAADF observation in combination with a phase separation simulation.

Original languageEnglish
Pages (from-to)197-201
Number of pages5
JournalScripta Materialia
Volume154
DOIs
Publication statusPublished - 2018 Sep

Keywords

  • Electron microscopy
  • Phase separation
  • Silica glass
  • Spinodal-type

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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