Convergent-beam electron diffraction (CBED) methods to determine the displacement vector of a stacking fault, the Burgers vector of a dislocation and the orientation difference between two domains adjoining at a coherent twin boundary are described.
|Number of pages||10|
|Journal||Journal of Electron Microscopy|
|Publication status||Published - 1991 Aug 1|
- Analytical electron microscopy
- Convergent-beam electron diffraction (CBED)
- Lattice defects
ASJC Scopus subject areas