Identification of lattice defects by convergent-beam electron diffraction

Michiyoshi Tanaka, Masami Terauchi, Toshikatsu Kaneyama

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)


Convergent-beam electron diffraction (CBED) methods to determine the displacement vector of a stacking fault, the Burgers vector of a dislocation and the orientation difference between two domains adjoining at a coherent twin boundary are described.

Original languageEnglish
Pages (from-to)211-220
Number of pages10
JournalJournal of Electron Microscopy
Issue number4
Publication statusPublished - 1991 Aug


  • Analytical electron microscopy
  • Convergent-beam electron diffraction (CBED)
  • Lattice defects

ASJC Scopus subject areas

  • Instrumentation


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