Identification of lattice defects by convergent-beam electron diffraction

Michiyoshi Tanaka, Masami Terauchi, Toshikatsu Kaneyama

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Convergent-beam electron diffraction (CBED) methods to determine the displacement vector of a stacking fault, the Burgers vector of a dislocation and the orientation difference between two domains adjoining at a coherent twin boundary are described.

Original languageEnglish
Pages (from-to)211-220
Number of pages10
JournalJournal of Electron Microscopy
Volume40
Issue number4
Publication statusPublished - 1991 Aug 1

Keywords

  • Analytical electron microscopy
  • Convergent-beam electron diffraction (CBED)
  • Lattice defects

ASJC Scopus subject areas

  • Instrumentation

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