Hygrothermal and thermal cyclic stresses on thin-film Si photovoltaic modules

Atsushi Masuda, Naomi Uchiyama, Chizuko Yamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Degradation behavior of thin-film Si photovoltaic modules by hygrothermal and thermal cyclic stresses was studied. Degradation progresses along the scribe lines for integration and from the slit on back sheet for taking out interconnector ribbons. Not only acetic acid generated by hydrolysis reaction between ethylene-vinyl acetate encapsulant and penetrating water vapor but also water vapor itself is the origin of degradation. It is important that high-barrier ability back sheet with low water-vapor transmission rate is employed and also important how suppress the water-vapor ingress from the slit on the back sheet. On the other hand, thin-film Si photovoltaic modules show high tolerance to thermal cyclic stress since only a few interconnector ribbons are employed.

Original languageEnglish
Title of host publicationAM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices
Subtitle of host publicationTFT Technologies and FPD Materials, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages98-99
Number of pages2
ISBN (Electronic)9784990875336
Publication statusPublished - 2017 Aug 8
Externally publishedYes
Event24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017 - Kyoto, Japan
Duration: 2017 Jul 42017 Jul 7

Publication series

NameAM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings

Conference

Conference24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017
Country/TerritoryJapan
CityKyoto
Period17/7/417/7/7

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computational Theory and Mathematics

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