HRTEM image contrast of short range order in Ni4Mo

S. Hata; D. Shindo; T. Mitate; N. Kuwano; S. Matsumura; K. Oki

doi:10.1016/S0968-4328(99)00134-1

HRTEM image contrast of short range order in Ni₄Mo

S. Hata, D. Shindo, T. Mitate, N. Kuwano, S. Matsumura, K. Oki

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

The high resolution transmission electron microscope (HRTEM) imaging of short range order (SRO) in Ni₄Mo was investigated by means of multi-slice image simulations. The HRTEM images of Ni₄Mo exhibit locally bright dot patterns corresponding to the [001] projections of the N₂M₂-type (chalcopyrite-like) structure. The multi-slice simulations revealed that the N₂M₂ patterns are rationalized as the projection patterns of the SRO structure which consists of subunit cell clusters of D1(a), D0₂₂ and Pt₂Mo structures. The N₂M₂-type image contrast appears when both the fundamental fcc lattice reflections and the 1 1/2 0 diffuse scattering of SRO contribute enough to imaging. This suggests that a good coincidence in intensity distribution between the Fourier power spectra of HRTEM images and the electron diffraction patterns is one of the conditions for the image contrast of SRO to be interpreted in terms of the projection contrast. (C) 2000 Elsevier Science Ltd.

Original language	English
Pages (from-to)	533-538
Number of pages	6
Journal	Micron
Volume	31
Issue number	5
DOIs	https://doi.org/10.1016/S0968-4328(99)00134-1
Publication status	Published - 2000 Oct
Externally published	Yes

Keywords

Diffuse scattering
Dynamical electron diffraction
High resolution transmission electron microscopy (HRTEM)
Monte Carlo simulation
Multi-slice image simulation
NiMo alloy
Projected potential
Short range order (SRO)

ASJC Scopus subject areas

Structural Biology
Materials Science(all)
Physics and Astronomy(all)
Cell Biology

Access to Document

10.1016/S0968-4328(99)00134-1

Cite this

@article{913cf607b95c490b80f0ef2ac1145b6b,

title = "HRTEM image contrast of short range order in Ni4Mo",

abstract = "The high resolution transmission electron microscope (HRTEM) imaging of short range order (SRO) in Ni4Mo was investigated by means of multi-slice image simulations. The HRTEM images of Ni4Mo exhibit locally bright dot patterns corresponding to the [001] projections of the N2M2-type (chalcopyrite-like) structure. The multi-slice simulations revealed that the N2M2 patterns are rationalized as the projection patterns of the SRO structure which consists of subunit cell clusters of D1(a), D022 and Pt2Mo structures. The N2M2-type image contrast appears when both the fundamental fcc lattice reflections and the 1 1/2 0 diffuse scattering of SRO contribute enough to imaging. This suggests that a good coincidence in intensity distribution between the Fourier power spectra of HRTEM images and the electron diffraction patterns is one of the conditions for the image contrast of SRO to be interpreted in terms of the projection contrast. (C) 2000 Elsevier Science Ltd.",

keywords = "Diffuse scattering, Dynamical electron diffraction, High resolution transmission electron microscopy (HRTEM), Monte Carlo simulation, Multi-slice image simulation, NiMo alloy, Projected potential, Short range order (SRO)",

author = "S. Hata and D. Shindo and T. Mitate and N. Kuwano and S. Matsumura and K. Oki",

note = "Funding Information: This study was partly supported by Grants-in-Aid for Scientific Research (b) (2) (#10450234) and (1) (#09242102, #09242106) from the Ministry of Education, Science, Sports and Culture, Japan. One of the authors (S.H.) is indebted for financial support to the Kazato Research Foundation, Japan.",

year = "2000",

month = oct,

doi = "10.1016/S0968-4328(99)00134-1",

language = "English",

volume = "31",

pages = "533--538",

journal = "Micron and Microscopica Acta",

issn = "0968-4328",

publisher = "Elsevier Limited",

number = "5",

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TY - JOUR

T1 - HRTEM image contrast of short range order in Ni4Mo

AU - Hata, S.

AU - Shindo, D.

AU - Mitate, T.

AU - Kuwano, N.

AU - Matsumura, S.

AU - Oki, K.

N1 - Funding Information: This study was partly supported by Grants-in-Aid for Scientific Research (b) (2) (#10450234) and (1) (#09242102, #09242106) from the Ministry of Education, Science, Sports and Culture, Japan. One of the authors (S.H.) is indebted for financial support to the Kazato Research Foundation, Japan.

PY - 2000/10

Y1 - 2000/10

N2 - The high resolution transmission electron microscope (HRTEM) imaging of short range order (SRO) in Ni4Mo was investigated by means of multi-slice image simulations. The HRTEM images of Ni4Mo exhibit locally bright dot patterns corresponding to the [001] projections of the N2M2-type (chalcopyrite-like) structure. The multi-slice simulations revealed that the N2M2 patterns are rationalized as the projection patterns of the SRO structure which consists of subunit cell clusters of D1(a), D022 and Pt2Mo structures. The N2M2-type image contrast appears when both the fundamental fcc lattice reflections and the 1 1/2 0 diffuse scattering of SRO contribute enough to imaging. This suggests that a good coincidence in intensity distribution between the Fourier power spectra of HRTEM images and the electron diffraction patterns is one of the conditions for the image contrast of SRO to be interpreted in terms of the projection contrast. (C) 2000 Elsevier Science Ltd.

AB - The high resolution transmission electron microscope (HRTEM) imaging of short range order (SRO) in Ni4Mo was investigated by means of multi-slice image simulations. The HRTEM images of Ni4Mo exhibit locally bright dot patterns corresponding to the [001] projections of the N2M2-type (chalcopyrite-like) structure. The multi-slice simulations revealed that the N2M2 patterns are rationalized as the projection patterns of the SRO structure which consists of subunit cell clusters of D1(a), D022 and Pt2Mo structures. The N2M2-type image contrast appears when both the fundamental fcc lattice reflections and the 1 1/2 0 diffuse scattering of SRO contribute enough to imaging. This suggests that a good coincidence in intensity distribution between the Fourier power spectra of HRTEM images and the electron diffraction patterns is one of the conditions for the image contrast of SRO to be interpreted in terms of the projection contrast. (C) 2000 Elsevier Science Ltd.

KW - Diffuse scattering

KW - Dynamical electron diffraction

KW - High resolution transmission electron microscopy (HRTEM)

KW - Monte Carlo simulation

KW - Multi-slice image simulation

KW - NiMo alloy

KW - Projected potential

KW - Short range order (SRO)

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