HRTEM and EELS characterization of atomic and electronic structures in Cu/α-Al 2 O 3 interfaces

T. Sasaki, T. Mizoguchi, K. Matsunaga, S. Tanaka, T. Yamamoto, M. Kohyama, Y. Ikuhara

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29 Citations (Scopus)

Abstract

Interfacial atomic structures of Cu/Al 2 O 3 (0 0 0 1) and Cu/Al 2 O 3 (1 1 2̄ 0) prepared by the pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM). It was found that (1 1 1) and (0 0 1) planes of Cu were epitaxially oriented to Al 2 O 3 (0 0 0 1) and Al 2 O 3 (1 1 2̄ 0) planes, respectively. Chemical bonding states at the interfaces were analysed by electron energy-loss spectroscopy (EELS). In oxygen-K edge energy-loss near-edge structure (O-K ELNES) of the Cu/Al 2 O 3 (0 0 0 1) and Cu/Al 2 O 3 (1 1 2̄ 0) interfaces, a shoulder peak appeared at the lower energy side of the main peak. This indicates that Cu-O interactions were formed across these Cu/Al 2 O 3 interfaces. In fact, the simulated HRTEM images based on the O-terminated interface models agreed well with the experimental ones. It can be concluded that the O-terminated interfaces were formed in the present Cu/Al 2 O 3 interfaces.

Original languageEnglish
Pages (from-to)87-90
Number of pages4
JournalApplied Surface Science
Volume241
Issue number1-2 SPEC. ISS.
DOIs
Publication statusPublished - 2005 Feb 28
Externally publishedYes

Keywords

  • Atomic structure
  • Cu/Al O interfaces
  • Electron energy-loss spectroscopy (EELS)
  • Electronic structure
  • High-resolution transmission electron microscopy (HRTEM)

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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