Holographic analysis of incident electron beam angular distribution of characteristic X-rays: Internal detector electron holography

Koichi Hayashi, Tomohiro Matsushita, Eiichiro Matsubara

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The incident electron beam angular distribution of Ti Kα characteristic X-rays from a strontium titanate single crystal was measured by scanning electron microscopy. The isotropy exhibits typical features observed in conventional photoelectron holography. Reconstructions by Fourier- transformation-based algorithm clearly show neighboring Sr and Ti atoms around Ti, the validity of which was verified by computer simulation. The demonstration paves the way to obtaining multiple energy holograms of nanostructured materials using the energy tunability of focused electron beams.

Original languageEnglish
Article number053601
Journaljournal of the physical society of japan
Volume75
Issue number5
DOIs
Publication statusPublished - 2006 May 1

Keywords

  • Characteristic x-rays
  • Crystal structure
  • Electron microscopy
  • Local structure
  • Photoelectron holography

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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