Hole trapping in amorphous HfO2 and Al2O3 as a source of positive charging

Jack Strand, Oliver A. Dicks, Moloud Kaviani, Alexander L. Shluger

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)

    Fingerprint Dive into the research topics of 'Hole trapping in amorphous HfO<sub>2</sub> and Al<sub>2</sub>O<sub>3</sub> as a source of positive charging'. Together they form a unique fingerprint.

    Engineering & Materials Science

    Chemical Compounds

    Physics & Astronomy