Highly angle-resolved X-ray photoelectron diffraction from solid surfaces

K. Tamura; S. Shiraki; H. Ishii; M. Owari; Y. Nihei

doi:10.1142/s0218625x03004974

Highly angle-resolved X-ray photoelectron diffraction from solid surfaces

K. Tamura, S. Shiraki, H. Ishii, M. Owari, Y. Nihei

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We have carried out the highly angle-resolved X-ray photoelectron diffraction (XPED) measurements by using the input-lens system for restriction of the detection angle. In the input-lens system, high angular resolution and high throughput are accomplished by placing an aperture not on the image plane but on the diffraction plane of electron optics. The aperture sizes (φ4 mm, φ2 mm, φ0.5 mm, φ0.25 mm) correspond to the angular resolutions (±0.6°, ±0.3°, ±0.08°, ±0.04°) respectively. Highly angle-resolved Ge3d XPED patterns from Ge(111) obtained by the angle-resolving system contain fine structure such as Kikuchi patterns. The fine structure was reproduced by multiple scattering cluster calculations.

Original language	English
Pages (from-to)	257-261
Number of pages	5
Journal	Surface Review and Letters
Volume	10
Issue number	2-3
DOIs	https://doi.org/10.1142/s0218625x03004974
Publication status	Published - 2003 Jan 1

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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abstract = "We have carried out the highly angle-resolved X-ray photoelectron diffraction (XPED) measurements by using the input-lens system for restriction of the detection angle. In the input-lens system, high angular resolution and high throughput are accomplished by placing an aperture not on the image plane but on the diffraction plane of electron optics. The aperture sizes (φ4 mm, φ2 mm, φ0.5 mm, φ0.25 mm) correspond to the angular resolutions (±0.6°, ±0.3°, ±0.08°, ±0.04°) respectively. Highly angle-resolved Ge3d XPED patterns from Ge(111) obtained by the angle-resolving system contain fine structure such as Kikuchi patterns. The fine structure was reproduced by multiple scattering cluster calculations.",

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AU - Shiraki, S.

AU - Ishii, H.

AU - Owari, M.

AU - Nihei, Y.

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