Highly accurate method for measuring ordinary and extraordinary refractive indices of liquid crystal materials, cell thickness, and pretilt angle of liquid crystal cells using ellipsometry

Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

A new method for measuring the ordinary and extraordinary refractive indices of liquid crystal materials with high accuracy was devised by considering the multiple interferences in the liquid crystal cell. Refractive indices, liquid crystal cell thickness, and pretilt angle can be obtained from the numerical fitting between the measured and calculated values of the wavelength-amplitude ratio characteristics at one incidence and the wavelength-phase retardation characteristics at three incidences. We also devised a new extended Jones matrix method that considers multiple interferences. We experimentally confirmed the validity of our new method: the multiple-interference tri incidence (MITI) method. Highly accurate parameters can be obtained using the MITI method, and it is effective for the design of highquality liquid crystal displays.

Original languageEnglish
Pages (from-to)515021-515029
Number of pages9
JournalJapanese journal of applied physics
Volume48
Issue number5
DOIs
Publication statusPublished - 2009 May 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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