Abstract
The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.
| Original language | English |
|---|---|
| Pages (from-to) | 4349-4353 |
| Number of pages | 5 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 40 |
| Issue number | 6 B |
| DOIs | |
| Publication status | Published - 2001 Jun |
Keywords
- Nonlinear dielectric constant
- Scanning nonlinear dielectric microscopy
- Scanning probe microscopy
- Surface layer observation
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)