Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

Y. Cho, K. Ohara

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.

Original languageEnglish
Pages (from-to)4349-4353
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number6 B
DOIs
Publication statusPublished - 2001 Jun

Keywords

  • Nonlinear dielectric constant
  • Scanning nonlinear dielectric microscopy
  • Scanning probe microscopy
  • Surface layer observation

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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