Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

Y. Cho; K. Ohara

doi:10.1143/jjap.40.4349

Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

Y. Cho, K. Ohara

Information Devices Division

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.

Original language	English
Pages (from-to)	4349-4353
Number of pages	5
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	40
Issue number	6 B
DOIs	https://doi.org/10.1143/jjap.40.4349
Publication status	Published - 2001 Jun

Keywords

Nonlinear dielectric constant
Scanning nonlinear dielectric microscopy
Scanning probe microscopy
Surface layer observation

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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AB - The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.

KW - Nonlinear dielectric constant

KW - Scanning nonlinear dielectric microscopy

KW - Scanning probe microscopy

KW - Surface layer observation

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IS - 6 B

ER -

Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

Abstract

Keywords

ASJC Scopus subject areas

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