Abstract
The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is also demonstrated that this higher order imaging is very useful for observing a non-ferroelectric surface layer with an unit cell thickness formed on a ferroelectric material.
| Original language | English |
|---|---|
| Pages (from-to) | 13-22 |
| Number of pages | 10 |
| Journal | Integrated Ferroelectrics |
| Volume | 38 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - 2001 Dec 1 |
| Event | 13th International Symposium on Integrated Ferroelectrics - Colorado Springs, CO, United States Duration: 2006 Mar 11 → 2006 Mar 14 |
Keywords
- Higher order nonlinear dielectric constant
- Scanning nonlinear dielectric microscopy
- Surface non-ferroelectric layer observation
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Control and Systems Engineering
- Ceramics and Composites
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry