TY - GEN
T1 - Higher-order moment of single-electron current noise in a double quantum dot
AU - Fujisawa, T.
AU - Hayashi, T.
AU - Hirayama, Yoshiro
PY - 2007/12/1
Y1 - 2007/12/1
N2 - Charge detection measurement on a double quantum dot allows bidirectional counting of single-electrons for extremely small current. We discuss higher-order moment of current noise in single-electron transport through a double quantum dot, and find that the third order moment is insensitive to the thermal noise. The counting statistics provides useful technique for studying correlated transport.
AB - Charge detection measurement on a double quantum dot allows bidirectional counting of single-electrons for extremely small current. We discuss higher-order moment of current noise in single-electron transport through a double quantum dot, and find that the third order moment is insensitive to the thermal noise. The counting statistics provides useful technique for studying correlated transport.
UR - http://www.scopus.com/inward/record.url?scp=77958462216&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77958462216&partnerID=8YFLogxK
U2 - 10.1063/1.2730109
DO - 10.1063/1.2730109
M3 - Conference contribution
AN - SCOPUS:77958462216
SN - 9780735403970
T3 - AIP Conference Proceedings
SP - 753
EP - 754
BT - Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
T2 - 28th International Conference on the Physics of Semiconductors, ICPS 2006
Y2 - 24 July 2006 through 28 July 2006
ER -