Abstract
In this paper, we demonstrate the use of thermal probe method that is capable of mapping Seebeck coefficient, thermal conductivity and contact resistance on a micrometer scale. We show the successful screening example on pseudo binary (Bi 1-xSb x) 2Te 3 (0.5<x<1) bulk composition-spread sample prepared by conventional powder metallurgy process. Another demonstration is a novel attempt to combine the combinatorial PLD and the thermal probe method. A pseudo ternary diagram of nickel-copper-manganese oxides fabricated on Nb doped STO substrate was used for the screening. The mapping of electrical resistance over the ternary diagram yields a lot of information, which is essential for materials researches on complex, multi-composition systems.
Original language | English |
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Pages (from-to) | 3-14 |
Number of pages | 12 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 804 |
Publication status | Published - 2003 Dec 1 |
Externally published | Yes |
Event | Combinatorial and Artificial Intelligence Methods in Materials Science II - Boston, MA., United States Duration: 2003 Dec 1 → 2003 Dec 4 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering