High-throughput screening of combinatorial materials libraries by high-energy x-ray diffraction

Dmitry A. Kukuruznyak, Harald Reichert, John Okasinski, Helmut Dosch, Toyohiro Chikyow, John Daniels, Veijo Honkimäki

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The authors introduce a method for high-throughput structural characterization of composition-spread thin-film libraries using high-energy x-ray beams in transmission geometry. Scanning the composition-spread film with the x-ray beam yields texture, and in case of polycrystalline spreads, crystal structure maps. In addition, regions with single-crystalline or epitaxial films can be readily identified and further characterized by tilting the sample and taking additional diffraction patterns at selected angles. The authors describe the application of this techniques to the ternary oxide system Ce O2 - Al2 O3 -Hf O2.

Original languageEnglish
Article number071916
JournalApplied Physics Letters
Volume91
Issue number7
DOIs
Publication statusPublished - 2007 Aug 24
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Kukuruznyak, D. A., Reichert, H., Okasinski, J., Dosch, H., Chikyow, T., Daniels, J., & Honkimäki, V. (2007). High-throughput screening of combinatorial materials libraries by high-energy x-ray diffraction. Applied Physics Letters, 91(7), [071916]. https://doi.org/10.1063/1.2771539